A versatile atomic force microscope for three-dimensional nanomanipulation and nanoassembly

Nanotechnology

Volumn 20, Issue 21, 2009, Pages

  Xie, Hui ^a   Haliyo, Dogan Sinan ^a   Regnier, Stephane ^a  

^a UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; FORCE SENSING; IMAGE SCANNING; NANO-ASSEMBLY; NANO-OBJECTS; NANOMANIPULATION; PICK-AND-PLACE; SILICON NANOWIRES; THREE-DIMENSIONAL (3D); ZERO-DIMENSIONAL;

ATOMIC FORCE MICROSCOPY; ATOMS; ELECTRIC WIRE; MICROMANIPULATORS; MICROSCOPES; NANOCANTILEVERS; NANOTECHNOLOGY; NANOWIRES; TWO DIMENSIONAL;

THREE DIMENSIONAL;

NANOWIRE; SILICON;

AIR; ARTICLE; ATOMIC FORCE MICROSCOPY; PRIORITY JOURNAL; SIMULATION; THREE DIMENSIONAL MANIPULATION FORCE MICROSCOPY; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INSTRUMENTATION; MICROMANIPULATION; NANOTECHNOLOGY; THREE DIMENSIONAL IMAGING;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; IMAGING, THREE-DIMENSIONAL; MICROMANIPULATION; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY;

EID: 67649188402     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/21/215301     Document Type: Article

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