A review of recent results on diamond vacuum lateral field emission device operation in radiation environments

Microelectronic Engineering

Volumn 88, Issue 9, 2011, Pages 2924-2929

  Subramanian, K ^a   Kang, W P ^a   Davidson, J L ^a   Ghosh, N ^a   Galloway, K F ^a  

^a VANDERBILT UNIVERSITY   (United States)

Author keywords

Carbon; Diamond MEMS; Extreme environment electronics; Lateral device; Nanodiamond; Transistor; Vacuum field emission microelectronics (VFEM)

Indexed keywords

CARBON; FIELD EMISSION; FIELD EMISSION CATHODES; FIELD EMISSION DISPLAYS; MICROELECTRONICS; NANODIAMONDS; TRANSISTORS;

ELECTRICAL CHARACTERISTIC; EXTREME ENVIRONMENT; LATERAL DEVICE; LATERAL FIELD EMISSION DEVICES; RADIATION ENVIRONMENTS; SOLID STATE ELECTRONICS; VACUUM FIELD EMISSION; VACUUM MICROELECTRONIC DEVICES;

NEUTRON IRRADIATION;

EID: 80051546080     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2011.03.161     Document Type: Article

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