Controlling adhesion force by means of nanoscale surface roughness

Langmuir

Volumn 27, Issue 16, 2011, Pages 9972-9978

  Ramakrishna, Shivaprakash N ^a   Clasohm, Lucy Y ^a   Rao, Akshata ^a   Spencer, Nicholas D ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION FORCES; CONTACT AREAS; MICRO-ELECTRO-MECHANICAL; MINIMUM VALUE; NANO-METER-SCALE; NANO-SCALE SURFACE ROUGHNESS; NANOELECTROMECHANICAL DEVICES; NANOPARTICLE DENSITY; NORMAL LOADS; PARTICLE DENSITIES; PARTICLE SPACING; PERFLUORODECALIN; PULL-OFF FORCES; SILICA NANOPARTICLES;

ADHESION; MICROELECTROMECHANICAL DEVICES; NANOPARTICLES; POLYETHYLENES; SILICA; SPHERES; SURFACE PROPERTIES; THERMOPLASTICS; VAN DER WAALS FORCES;

SURFACE ROUGHNESS;

EID: 80051532787     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la201727t     Document Type: Article

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