Optimal roughness for minimal adhesion

Applied Physics Letters

Volumn 91, Issue 4, 2007, Pages

  Liu, D L ^a   Martin, J ^b   Burnham, N A ^a  

^a Worcester Polytechnic Institute   (United States)

^b ANALOG DEVICES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; MEMS; SILICON WAFERS;

ADHESIVE FORCES; NANOSCALE-CONTACT MECHANICS; SINGLE-ASPERITY MODEL;

SURFACE ROUGHNESS;

EID: 34547478306     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2763981     Document Type: Article

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