Interaction force measurements using atomic force microscopy for characterization and control of adhesion, dispersion and lubrication in particulate systems

Journal of Adhesion Science and Technology

Volumn 19, Issue 8, 2005, Pages 611-626

  Esayanur, Madhavan S ^a   Yeruva, Suresh B ^a   Rabinovich, Yakov I ^b   Moudgil, Brij M ^a,b  

^a University of Florida   (United States)

^b UNIVERSITY OF FLORIDA   (United States)

Author keywords

Adhesion; Atomic force microscopy; Capillary force; Colloid stability; Friction force; Nanoscale roughness; Nanotribology; Surfactant

Indexed keywords

ADHESION; ADSORPTION; AGGREGATES; ATOMIC FORCE MICROSCOPY; CHEMICAL MECHANICAL POLISHING; COLLOIDS; DISPERSIONS; IONIC STRENGTH; OPTIMIZATION; PH EFFECTS; SURFACE ACTIVE AGENTS; SURFACE ROUGHNESS; AGGLOMERATION; MECHANICAL PROPERTIES; NANOTRIBOLOGY; SUGAR INDUSTRY;

CAPILLARY FORCE; COLLOID STABILITY; FRICTION FORCE; NANOSCALE ROUGHNESS; NANOTRIBOLOGY;

PARTICLES (PARTICULATE MATTER); ADHESION;

ATOMIC FORCE; CAPILLARY FORCE; COLLOID STABILITY; FRICTION FORCE; NANO-SCALE ROUGHNESS; SURFACTANT;

EID: 25444479969     PISSN: 01694243     EISSN: None     Source Type: Journal    
DOI: 10.1163/1568561054890516     Document Type: Article

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