Deformation of soft colloidal probes during AFM pull-off force measurements: Elimination of nano-roughness effects

Journal of Adhesion Science and Technology

Volumn 19, Issue 3-5, 2005, Pages 181-198

  Tormoen, Garth W ^a   Drelich, Jaroslaw ^a  

^a Michigan Technological University   (United States)

Author keywords

Adhesion; Atomic force microscopy; Colloidal probe technique; Deformable probes; Pull off forces; Roughness

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; CLEANING; COLLOIDS; NANOTECHNOLOGY; PLASTICITY; POLYETHYLENES; POLYSTYRENES; PROBES; SURFACE ACTIVE AGENTS; SURFACE ROUGHNESS; DEFORMATION; SILICON WAFERS;

COLLOIDAL PROBE TECHNIQUES; DEFORMABLE PROBES; ELASTIC DEFORMATION; PULL-OFF FORCES;

DEFORMATION; PROBES;

AFM; APPLIED LOADS; ATOMIC FORCE; COLLOIDAL PROBE TECHNIQUES; COLLOIDAL PROBES; CONTACT AREAS; DEFORMABLE PROBES; NANO-SIZED; NANOROUGHNESS; PULL-OFF FORCES; ROUGHNESS EFFECTS; STANDARD DEVIATION; SUBSTRATE SURFACE; SURFACE ASPERITIES;

EID: 22544488387     PISSN: 01694243     EISSN: None     Source Type: Journal    
DOI: 10.1163/1568561054352603     Document Type: Article

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