The influence of surface roughness on the adhesion force

Surface and Interface Analysis

Volumn 36, Issue 8, 2004, Pages 694-697

  Meine, K ^a   Kloss K ^a   Schneider, T ^a   Spaltmann, D ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

Adhesion; AFM; JKR model; Roughness; Surface energy; UHV

Indexed keywords

CIRCUMFERENCE; JOHNSON, KENDALL AND ROBERTS (JKR) MODEL; ROUGHNESS CONSTANT;

ADHESION; APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; INTERFACIAL ENERGY; MATHEMATICAL MODELS; SILICON WAFERS; ULTRAHIGH VACUUM;

SURFACE ROUGHNESS;

EID: 4444246085     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1738     Document Type: Conference Paper

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