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Volumn 248, Issue 8, 2011, Pages 1908-1914

Growth temperature dependence of the electrical and structural properties of epitaxial graphene on SiC(0001)

Author keywords

AES; AFM; Graphene; Hall effect; SiC

Indexed keywords


EID: 79960878359     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.201046368     Document Type: Article
Times cited : (13)

References (31)
  • 24
    • 79960858156 scopus 로고    scopus 로고
    • Characteristics of Graphite Films on Silicon- and Carbon-terminated Faces of Silicon Carbide, Doctoral Thesis, Georgia Institute of Technology
    • T. Li, Characteristics of Graphite Films on Silicon- and Carbon-terminated Faces of Silicon Carbide, Doctoral Thesis, Georgia Institute of Technology (2006).
    • (2006)
    • Li, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.