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Volumn 88, Issue 8, 2011, Pages 1944-1947
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Development of interference lithography for 22 nm node and below
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Author keywords
Extreme ultraviolet; Interference; Resist; Transmission grating; Undulator
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Indexed keywords
BEAM LINES;
CHEMICALLY AMPLIFIED RESIST;
EUV RESISTS;
EXPOSURE TOOL;
EXTREME ULTRAVIOLET;
EXTREME ULTRAVIOLETS;
INTERFERENCE LITHOGRAPHY;
RESIST;
TRANSMISSION GRATING;
TRANSMISSION GRATINGS;
ELECTRON BEAMS;
EXPOSURE METERS;
PHOTORESISTS;
PLASMA ETCHING;
WET ETCHING;
WIGGLERS;
NANOTECHNOLOGY;
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EID: 79960047338
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2011.02.076 Document Type: Conference Paper |
Times cited : (11)
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References (14)
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