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Volumn 88, Issue 8, 2011, Pages 1944-1947

Development of interference lithography for 22 nm node and below

Author keywords

Extreme ultraviolet; Interference; Resist; Transmission grating; Undulator

Indexed keywords

BEAM LINES; CHEMICALLY AMPLIFIED RESIST; EUV RESISTS; EXPOSURE TOOL; EXTREME ULTRAVIOLET; EXTREME ULTRAVIOLETS; INTERFERENCE LITHOGRAPHY; RESIST; TRANSMISSION GRATING; TRANSMISSION GRATINGS;

EID: 79960047338     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2011.02.076     Document Type: Conference Paper
Times cited : (11)

References (14)
  • 2
    • 79960030867 scopus 로고    scopus 로고
    • ITRS Roadmap
    • ITRS Roadmap [< http://www.itrs.net/ >].


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.