Experimental investigation of strain rate dependence of nanocrystalline Pt films

Proceedings of the Society for Experimental Mechanics, Inc.

Volumn 67, Issue , 2010, Pages 25-35

  Jonnalagadda, K N ^a   Chasiotis, I ^b   Yagnamurthy, S ^b   Lambros, J ^b   Pulskamp, J ^c   Polcawich, R ^c   Dubey, M ^c  

^a Johns Hopkins University   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^c U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

Digital image correlation; Mechanical properties; Nanocrystalline platinum; Strain rate; Thin films

Indexed keywords

DIGITAL IMAGE CORRELATIONS; DISPLACEMENT MEASUREMENTS; DISPLACEMENT RESOLUTION; ELASTIC LIMIT; ELASTIC PROPERTIES; EXPERIMENTAL INVESTIGATIONS; EXPERIMENTAL METHODS; FULL-FIELD; GRAIN SIZE; IN-SITU; LOADING RATE; MECHANICAL BEHAVIOR; METALLIC THIN FILMS; MICRO-SCALES; MICRON SCALE; NANOCRYSTALLINE PLATINUM; NANOCRYSTALLINES; OPTICAL IMAGE; OPTICAL MICROSCOPES; ORDERS OF MAGNITUDE; POISSON'S RATIO; PROPERTY VALUE; PT FILMS; SPECKLE PATTERNS; STRAIN CURVES; STRAIN RATE DEPENDENCE; STRAIN-RATE-DEPENDENT; UNIAXIAL STRESS; UNIAXIAL TENSIONS;

GEOMETRICAL OPTICS; IMAGE ANALYSIS; MECHANICAL ENGINEERING; MECHANICAL TESTING; PLATINUM; POISSON RATIO; STRAIN MEASUREMENT; THIN FILMS;

STRAIN RATE;

EID: 79960031220     PISSN: 10466789     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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