Increased strain rate sensitivity due to stress-coupled grain growth in nanocrystalline Al

Scripta Materialia

Volumn 55, Issue 7, 2006, Pages 649-652

  Gianola, D S ^a   Warner, D H ^a   Molinari, J F ^a   Hemker, K J ^a  

^a Johns Hopkins University   (United States)

Author keywords

Grain boundary migration; Molecular dynamics; Nanocrystalline materials; Strain rate sensitivity; Thin films

Indexed keywords

ALUMINUM; GRAIN BOUNDARIES; MOLECULAR DYNAMICS; NUCLEATION; STRAIN RATE; STRESSES; THIN FILMS;

GRAIN BOUNDARY MIGRATION; SLIDING; STRAIN RATE SENSITIVITY;

NANOSTRUCTURED MATERIALS;

EID: 33746221382     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2006.06.002     Document Type: Article

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