Scanning transmission electron microscopy imaging dynamics at low accelerating voltages

Ultramicroscopy

Volumn 111, Issue 8, 2011, Pages 999-1013

  Lugg, N R ^a   Findlay, S D ^b   Shibata, N ^b,c   Mizoguchi, T ^d   D'Alfonso, A J ^a   Allen, L J ^a   Ikuhara, Y ^b,e,f  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b UNIVERSITY OF TOKYO   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^e JAPAN FINE CERAMICS CENTER   (Japan)

^f TOHOKU UNIVERSITY   (Japan)

Author keywords

Annular bright field (ABF); Electron energy loss spectroscopy (EELS); High angle annular dark field (HAADF); Low accelerating voltages; Scanning transmission electron microscopy (STEM)

Indexed keywords

ACCELERATING VOLTAGES; BRIGHT FIELDS; ELECTRON ENERGY LOSS; FAST ELECTRONS; HIGH-ANGLE ANNULAR DARK FIELDS; INELASTIC INTERACTION; LOW ACCELERATING VOLTAGE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); SPECTROSCOPIC IMAGING;

DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRONS; ENERGY DISSIPATION; SCANNING; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; ELECTRIC POTENTIAL; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE DISPLAY; IMAGE QUALITY; MATHEMATICAL COMPUTING; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 79959937889     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.02.009     Document Type: Article

References (38)

1. Phillipp F., Höschen R., Osaki M., Möbus G., Rühle M. Ultramicroscopy 1994, 56:1.
2. Egerton R.F., Li P., Malac M. Micron 2004, 35:399.
3. Kim H.S., Sheinin S.S. Phys. Status Solidi (b) 1982, 109:807.
4. Krivanek O.J., Dellby N., Murfitt M.F., Chisholm M.F., Pennycook T.J., Suenaga K., Nicolosi V. Ultramicroscopy 2010, 110:935.
5. Sawada H., Sasaki T., Hosokawa F., Yuasa S., Terao M., Kawazoe M., Nakamichi T., Kaneyama T., Kondo Y., Kimoto K., Suenaga K. Ultramicroscopy 2010, 110:958.
6. Krivanek O.J., Chisholm M.F., Nicolosi V., Pennycook T.J., Corbin G.J., Dellby N., Murfitt M.F., Own C.S., Szilagyi Z.S., Oxley M.P., Pantelides S.T., Pennycook S.J. Nature 2010, 464:571.
7. Suenaga K., Sato Y., Liu Z., Kataura H., Okazaki T., Kimoto K., Sawada H., Sasaki T., Omoto K., Tomita T., Kaneyama T., Kondo Y. Nat. Chem. 2009, 1:415.
8. Botton G.A., Lazar S., Dwyer C. Ultramicroscopy 2010, 110:926.
9. Williams D.B., Carter C.B. Transmission Electron Microscopy 1996, Plenum Press, New York.
10. Egerton R.F. Ultramicroscopy 2007, 107:575.
11. Okunishi E., Ishikawa I., Sawada H., Hosokawa F., Hori M., Kondo Y. Microsc. Microanal. 2009, 15(Suppl 2):164.
12. Findlay S.D., Shibata N., Sawada H., Okunishi E., Kondo Y., Yamamoto T., Ikuhara Y. Appl. Phys. Lett. 2009, 95:191913.
13. Findlay S.D., Shibata N., Sawada H., Okunishi E., Kondo Y., Ikuhara Y. Ultramicroscopy 2010, 110:903.
14. Loane R.F., Xu P., Silcox J. Ultramicroscopy 1992, 40:121.
15. Findlay S.D., Oxley M.P., Allen L.J. Microsc. Microanal. 2008, 14:48.
16. Allen L.J., Josefsson T.W. Phys. Rev. B. 1995, 52:3184.
17. Geuens P., Van Dyck D. Adv. Imaging Electron Phys. 2005, 136:111.
18. Op de Beeck M., Van Dyck D. Phys. Status Solidi (A) Appl. Res. 1995, 150:587.
19. Peng Y., Nellist P.D., Pennycook S.J. J. Electron Microsc. 2004, 53:257.
20. Allen L.J., Findlay S.D., Oxley M.P., Rossouw C.J. Ultramicroscopy 2003, 96:47.
21. Dwyer C., Etheridge J. Ultramicroscopy 2003, 96:343.
22. Cherns D., Howie A., Jacobs M.H. Z. Naturforsch. A 1973, 28:565.
23. Ishizuka K. J. Electron Microsc. 2001, 50:291.
24. Ishizuka K. Ultramicroscopy 2002, 90:71.
25. Allen L.J., Rossouw C.J. Phys. Rev. B 1990, 42:11644.
26. Bird D.M., King Q.A. Acta Crystallogr. A 1990, 46:202.
27. Kohl H., Rose H. Adv. Electron. Electron Phys. 1985, 65:173.
28. Muller D.A., Silcox J. Ultramicroscopy 1995, 59:195.
29. Rafferty B., Pennycook S.J. Ultramicroscopy 1999, 78:141.
30. Allen L.J., Findlay S.D., Lupini A.R., Oxley M.P., Pennycook S.J. Phys. Rev. Lett. 2003, 91:105503.
31. Cosgriff E.C., Oxley M.P., Allen L.J., Pennycook S.J. Ultramicroscopy 2005, 102:317.
32. Oxley M.P., Cosgriff E.C., Allen L.J. Phys. Rev. Lett. 2005, 94:203906.
33. Dwyer C. Ultramicroscopy 2005, 104:141.
34. Dwyer C., Findlay S.D., Allen L.J. Phys. Rev. B 2008, 77:184107.
35. D'Alfonso A.J., Cosgriff E.C., Findlay S.D., Behan G., Kirkland A.I., Nellist P.D., Allen L.J. Ultramicroscopy 2008, 108:1567.
36. Coene W., Van Dyck D. Ultramicroscopy 1990, 33:261.
37. D'Alfonso A.J., Findlay S.D., Oxley M.P., Allen L.J. Ultramicroscopy 2008, 108:677.
38. Bando Y., Matsui Y., Uemura Y., Oikawa T., Suzuki S., Honda T., Harada Y. Ultramicroscopy 1985, 18:117.