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Volumn 257, Issue 20, 2011, Pages 8326-8329
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Effect of structure variation on thermal conductivity of hydrogenated silicon film
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Author keywords
Gradient; Microcrystalline; Silicon film; Thermal conductivity
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Indexed keywords
GRADIENT METHODS;
HYDROGENATION;
METALLIC FILMS;
MICROCRYSTALLINE SILICON;
PLASMA CVD;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SPECTROSCOPIC ELLIPSOMETRY;
THERMAL CONDUCTIVITY;
VOLUME FRACTION;
CRYSTALLINE SILICONS;
CRYSTALLINE VOLUME FRACTION;
EFFECTIVE MEDIUM;
HYDROGENATED SILICON;
MICROCRYSTALLINE;
MICROCRYSTALLINE FILMS;
SILICON FILMS;
STRUCTURE VARIATION;
THERMAL CONDUCTIVITY OF SOLIDS;
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EID: 79959344030
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2011.03.107 Document Type: Article |
Times cited : (5)
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References (32)
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