Pattern center determination in electron backscatter diffraction microscopy

Microscopy and Microanalysis

Volumn 17, Issue 3, 2011, Pages 330-340

  Basinger, Jay ^a,b   Fullwood, David ^b   Kacher, Josh ^c   Adams, Brent ^b  

^a 435 Crabtree Building ^*  (United States)

^b Department of Electrical and Computer Engineering   (United States)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

convolution; EBSD; pattern center; spherical projection

Indexed keywords

EID: 79958841905     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611000389     Document Type: Article

References (22)

1. Adams, B.L.,Wright, S.I. & Kunze, K. (1993). Orientation imaging: The emergence of a new microscopy. Metall Trans A 24A(4), 819-831.
2. Britton, T.B., Maurice, C., Fortunier, R., Driver, J.H., Day, A.P., Meaden, G., Dingley, D.J., Mingard, K. & Wilkinson, A.J. (2010). Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns. Ultramicroscopy 110(12), 1443-1453.
3. Burns, J.B., Hanson, A.R. & Riseman, E.M. (1986). Extracting straight lines. IEEE Trans Pattern Anal Machine Intell PAMI- 8(4), 425-455.
4. Carpenter, D.A., Pugh, J.L., Richardson, G.D. & Mooney, L.R. (2007). Determination of pattern centre in EBSD using the moving-screen technique. J Microsc 227(September), 246-247. (Pubitemid 47339676)
5. Day, A.P. (2008). Spherical EBSD. J Microsc 230(3), 472-486. (Pubitemid 351747872)
6. Day, A.P. (2009). Spherical Kikuchi maps and other rareities. In Electron Backscatter Diffraction in Materials Science, Schwartz, A.J., Kumar, M., Adams, B.L. & Field, D.P. (Eds.), pp. 65-80. New York: Kluwer Academic/Plenum Publishers.
7. EDAX (2010). OIM 6.0. Draper, UT: EDAX-TSL.
8. Engler, O. & Randle, V. (2010). Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping. Boca Raton, FL: CRC Press/Taylor and Francis Group.
9. Kacher, J., Basinger, J., Adams, B.L. & Fullwood, D.T. (2010). Reply to comment by Maurice et al. in response to "Bragg's Law Diffraction Simulations for Electron Backscatter Diffraction Analysis." Ultramicroscopy 110(7), 760-762.
10. Kacher, J., Landon, C., Adams, B. & Fullwood, D. (2009). Bragg's Law diffraction simulations for electron backscatter diffraction analysis. Ultramicroscopy 109(9), 1148-1156.
11. Keiner, J. (2005). Fast Spherical Fourier Transforms and Applications. Lübeck, Germany: Institut für Mathematik, Universität zu Lübeck.
12. Krieger Lassen, N.C. (1999). Source point calibration from an arbitrary electron backscattering pattern.J Microsc 195, 204-211. (Pubitemid 29444731)
13. Krieger Lassen, N.C., Conradsen, K. & Juul Jensen, D. (1992). Image-processing procedures for analysis of electron back scattering patterns. Scanning Microsc 6(1), 115-121.
14. Mathworks (2008). Matlab. Natwick, MA: The Mathworks, Inc.
15. Maurice, C., Dzieciol, K. & Fortunier, R. (2011). A method for accurate localisation of EBSD pattern centres. Ultramicroscopy 111(2), 140-148.
16. Maurice, C., Fortunier, R., Driver, J., Day, A., Mingard, K. & Meaden, G. (2010). Comments on the paper "Bragg's law diffraction simulations for electron backscatter diffraction analysis" by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood. Ultramicroscopy 110(7), 758-759.
17. Venables, J.A. & Bin Jaya, R. (1977). Accurate microcrystallography using electron back-scattering patterns. Phil Mag 35(5), 1317-1332.
18. Villert, S., Maurice, C., Wyon, C. & Fortunier, R. (2009). Accuracy assessment of elastic strain measurement by EBSD. J Microsc 233(2), 290-301.
19. Wilkinson, A.J. (2006). High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction. Appl Phys Lett 89, 242109.
20. Wilkinson, A.J., Meaden, G. & Dingley, D.J. (2006). Highresolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity. Ultramicroscopy 106, 307-313. (Pubitemid 43287017)
21. Winkelmann, A., Trager-Cowan, C., Sweeney, F., Day, A.P. & Parbrook, P. (2007). Many-beam dynamical simulation of electron backscatter diffraction patterns. Ultramicroscopy 107, 414-421. (Pubitemid 46136734)
22. Wright, S.I. (1993). Review of automated orientation imaging microscopy (OIM). J Computer-Assisted Microsc 5(3), 207-221.