Determination of pattern centre in EBSD using the moving-screen technique

Journal of Microscopy

Volumn 227, Issue 3, 2007, Pages 246-247

  Carpenter, D A ^a   Pugh, J L ^a   Richardson, G D ^b   Mooney, L R ^a  

^a Y 12 NATIONAL SECURITY COMPLEX   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Calibration; Electron backscatter diffraction; Moving screen technique; Scanning electron microscopy

Indexed keywords

BACKSCATTERING; CALIBRATION; ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CALIBRATION PARAMETERS; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; HIGH-PRECISION; INITIAL ESTIMATE; MAGNIFICATION METHOD; METHOD OF CALIBRATIONS; MOVING-SCREEN TECHNIQUE;

HOUGH TRANSFORMS;

ARTICLE; AUTOMATION; CALIBRATION; CAMERA; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

EID: 34548337063     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2007.01807.x     Document Type: Article

References (6)

1. Hjelen, J., Oersund, R., Hoel, E., Runde, P., Furu, T. & Nes, E. (1993) EBSP: progress in technique and application. Textures Microstruct. 20, 29 40.
2. Krieger Lassen, N.C. (1999) Source point calibration from an arbitrary electron backscattering pattern. J. Microsc. 195, 204 211.
3. Michael, J.R. & Goehner, R.P. (1995) Development of backscatter electron Kikuchi patterns for phase identification in the SEM. Developments in Materials Characterization Technologies. Albuquerque, NM; 23-24 July, 63 70.
4. Randle, V. (1992) Microtexture Determination and its Applications. The Institute of Metals, Carlton House Terrace, London.
5. Randle V. & Engler, O. (2000) Introduction to Texture Analysis, Macrotexture, Microtexture & Orientation Mapping. Gordon and Breach, Amsterdam, the Netherlands.
6. Tao, X. & Eades, A. (2005) Errors, artifacts, and improvements in EBSD processing and mapping. Microsc. Microanal., 11, 79 87.