Reply to comment by Maurice et al. in response to "Bragg's Law Diffraction Simulations for Electron Backscatter Diffraction Analysis"

Ultramicroscopy

Volumn 110, Issue 7, 2010, Pages 760-762

  Kacher, Josh ^a   Basinger, Jay ^a   Adams, Brent L ^a   Fullwood, David T ^a  

^a BRIGHAM YOUNG UNIVERSITY   (United States)

Author keywords

EBSD; Scanning electron microscope; Strain

Indexed keywords

BACKSCATTERING; CRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; STRAIN;

BRAGG'S LAW; DIFFRACTION SIMULATION; EBSD; ELASTIC STRAIN MEASUREMENT; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION ANALYSIS; GEOMETRY CALIBRATION;

ELECTRON DIFFRACTION;

ARTICLE; CALIBRATION; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON DIFFRACTION; GEOMETRY; KINEMATICS; MICROSCOPY; SENSITIVITY ANALYSIS; SIMULATION;

EID: 77953545428     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.03.007     Document Type: Article

References (6)

1. Villert S., Maurice C., Wyon C., Fortunier R. Accuracy assessment of elastic strain measurement by EBSD. Journal of Microscopy 2009, 233:290.
2. Kacher J., Landon C., Adams B.L., Fullwood D. Bragg's law diffraction simulations for electron backscatter diffraction analysis. Ultramicroscopy 2009, 109:1148.
3. Wilkinson A.J., Meaden G., Dingley D.J. High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity. Ultramicroscopy 2006, 106:307.
4. J. Kacher, High resolution cross-correlation-based texture analysis using kinematically simulated EBSD patterns, Mechanical Engineering Department, vol. MS. Provo, Utah, Brigham Young University, 2009. http://contentdm.lib.byu.edu/ETD/image/etd2994.pdf.
5. Kacher J., Adams B., Fullwood D. , Detection of Tetragonalities and Pseudo-Symmetries by High Resolution EBSD Methods 2009, MS&T, Pittsburgh.
6. Winkelmann A., Trager-Cowan C., Sweeney F., Day A.P., Parbrook P. Many-beam dynamical simulation of electron backscatter diffraction patterns. Ultramicroscopy 2007, 107:414.