메뉴 건너뛰기




Volumn , Issue , 2009, Pages 65-80

Spherical Kikuchi maps and other rarities

Author keywords

[No Author keywords available]

Indexed keywords


EID: 78049251970     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-0-387-88136-2_5     Document Type: Chapter
Times cited : (12)

References (56)
  • 2
    • 3643076044 scopus 로고
    • Über Bänder bei Elektronenbeugung
    • Boersch H (1937) Über Bänder bei Elektronenbeugung, Z Techn Phys 18:574-578
    • (1937) Z Techn Phys , vol.18 , pp. 574-578
    • Boersch, H.1
  • 3
    • 0003577131 scopus 로고    scopus 로고
    • Springer, Berlin, ISBN 3-540-65199-3
    • Braun W (1999) Applied RHEED. Springer, Berlin, ISBN 3-540-65199-3
    • (1999) Applied RHEED
    • Braun, W.1
  • 4
    • 0038698685 scopus 로고    scopus 로고
    • D. Phil. thesis, Robotics Research Group, Department of Engineering Science, University of Oxford
    • Capel A (2001) Image mosaicing and super-resolution. D. Phil. thesis, Robotics Research Group, Department of Engineering Science, University of Oxford
    • (2001) Image Mosaicing and super-resolution
    • Capel, A.1
  • 6
    • 44349116281 scopus 로고    scopus 로고
    • Spherical EBSD
    • Day AP (2008) Spherical EBSD. J Microsc 230(Pt 3):472-486
    • (2008) J Microsc , vol.230 , Issue.PART 3 , pp. 472-486
    • Day, A.P.1
  • 7
    • 0032876424 scopus 로고    scopus 로고
    • A comparison of grain imaging and measurement using horizontal orientation and colour orientation contrast imaging, electron backscatter pattern and optical methods
    • Day AP, Quested TE (1999) A comparison of grain imaging and measurement using horizontal orientation and colour orientation contrast imaging, electron backscatter pattern and optical methods. J Microsc 195(Pt 3):186-196
    • (1999) J Microsc , vol.195 , Issue.PART 3 , pp. 186-196
    • Day, A.P.1    Quested, T.E.2
  • 8
    • 0004211864 scopus 로고    scopus 로고
    • Assessment of local residual strain by electron backscatter patterns and nanoindentation
    • Day AP, Shafirstein G (1996) Assessment of local residual strain by electron backscatter patterns and nanoindentation. Mater Sci Tech 12:873
    • (1996) Mater Sci Tech , vol.12 , pp. 873
    • Day, A.P.1    Shafirstein, G.2
  • 9
    • 44349155301 scopus 로고    scopus 로고
    • A novel way to represent the 32 crystallographic point groups
    • De Graef M (1998) A novel way to represent the 32 crystallographic point groups. J Mater Educ 20:31-42
    • (1998) J Mater Educ , vol.20 , pp. 31-42
    • De Graef, M.1
  • 13
    • 77954670040 scopus 로고
    • The study of surface structure by electron diffraction
    • Finch GI, Wilman H (1937) The study of surface structure by electron diffraction. Erg Exakt Naturwiss 16:353-436
    • (1937) Erg Exakt Naturwiss , vol.16 , pp. 353-436
    • Finch, G.I.1    Wilman, H.2
  • 14
    • 0000502703 scopus 로고    scopus 로고
    • Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns
    • Goehner RP, Michael JR (1996) Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns. J Res Natl Inst Stan 101:301-308
    • (1996) J Res Natl Inst Stan , vol.101 , pp. 301-308
    • Goehner, R.P.1    Michael, J.R.2
  • 17
    • 0003607343 scopus 로고
    • Master's thesis, Department of Electrical Engineering and Computer Science, University of California
    • Heckbert PS (1989) Fundamentals of texture mapping and image warping. Master's thesis, Department of Electrical Engineering and Computer Science, University of California
    • (1989) Fundamentals of Texture Mapping and Image Warping
    • Heckbert, P.S.1
  • 21
    • 0006320063 scopus 로고
    • Electron channelling patterns in the scanning electron microscope
    • Holt DB, Muir MD, Boswarva IM, Grant PR eds, Academic Press, New York
    • Joy DC (1974) Electron channelling patterns in the scanning electron microscope. In: Holt DB, Muir MD, Boswarva IM, Grant PR (eds) Quantitative scanning electron microscopy. Academic Press, New York
    • (1974) Quantitative Scanning Electron Microscopy
    • Joy, D.C.1
  • 23
    • 0026772737 scopus 로고
    • Image processing procedures for analysis of electron backscatter patterns
    • Krieger Lassen NC, Juul Jensen D, Conradsen K (1992) Image processing procedures for analysis of electron backscatter patterns. Scan Microsc 6:115-121
    • (1992) Scan Microsc , vol.6 , pp. 115-121
    • Krieger Lassen, N.C.1    Juul Jensen, D.2    Conradsen, K.3
  • 24
    • 0026771979 scopus 로고
    • Ab initio primitive cell parameters from single convergent-beam electron diffraction patterns: A converse route to the identification of microcrystals with electrons
    • Le Page Y (1992) Ab initio primitive cell parameters from single convergent-beam electron diffraction patterns: A converse route to the identification of microcrystals with electrons. Microsc Res Techniq 21:158-165
    • (1992) Microsc Res Techniq , vol.21 , pp. 158-165
    • Le Page, Y.1
  • 27
    • 0022926240 scopus 로고
    • A spherical electron-channelling pattern map for use in quartz petrofabric analysis
    • Lloyd GE, Ferguson CC (1986) A spherical electron-channelling pattern map for use in quartz petrofabric analysis. J Struct Geol 8(5):517-526
    • (1986) J Struct Geol , vol.8 , Issue.5 , pp. 517-526
    • Lloyd, G.E.1    Ferguson, C.C.2
  • 28
    • 44349150564 scopus 로고    scopus 로고
    • A 3D Hough transform for indexing EBSD and Kossel patterns
    • Maurice C, Fortunier R (2008) A 3D Hough transform for indexing EBSD and Kossel patterns. J Microsc 230(Pt 3):520-529
    • (2008) J Microsc , vol.230 , Issue.PART 3 , pp. 520-529
    • Maurice, C.1    Fortunier, R.2
  • 29
    • 0022831670 scopus 로고
    • Blackwell Scientific Publications, Oxford, UK, ISBN 0-632-01574-8
    • McKie D, McKie C (1986) Essentials of crystallography. Blackwell Scientific Publications, Oxford, UK, ISBN 0-632-01574-8
    • (1986) Essentials of Crystallography
    • McKie, D.1    McKie, C.2
  • 30
    • 0343392878 scopus 로고
    • Crystallographic phase identification in the scanning electron microscope: Backscattered electron Kikuchi patterns imaged with a CCD-based detector
    • Michael JR, Goehner RP (1993) Crystallographic phase identification in the scanning electron microscope: Backscattered electron Kikuchi patterns imaged with a CCD-based detector. MSA Bull 23:168
    • (1993) MSA Bull , vol.23 , pp. 168
    • Michael, J.R.1    Goehner, R.P.2
  • 31
    • 0034159998 scopus 로고    scopus 로고
    • Use of reciprocal lattice layer spacing in electron backscatter diffraction pattern analysis
    • Michael JR, Eades JA (2000) Use of reciprocal lattice layer spacing in electron backscatter diffraction pattern analysis. Ultramicroscopy 81:67-81
    • (2000) Ultramicroscopy , vol.81 , pp. 67-81
    • Michael, J.R.1    Eades, J.A.2
  • 34
    • 0033559254 scopus 로고    scopus 로고
    • Feldspar fabrics in a greenschist facies albite-rich mylonite from electron backscatter diffraction
    • Prior DJ, Wheeler J (1999) Feldspar fabrics in a greenschist facies albite-rich mylonite from electron backscatter diffraction. Tectonophysics 303:29-49
    • (1999) Tectonophysics , vol.303 , pp. 29-49
    • Prior, D.J.1    Wheeler, J.2
  • 35
    • 0024090855 scopus 로고
    • Observations of deformation and fracture heterogeneities in a nickelbase superalloy using electron backscattering patterns
    • Quested PN, Henderson PJ, McLean M (1988) Observations of deformation and fracture heterogeneities in a nickelbase superalloy using electron backscattering patterns. Acta Metall 36:2743-2752
    • (1988) Acta Metall , vol.36 , pp. 2743-2752
    • Quested, P.N.1    Henderson, P.J.2    McLean, M.3
  • 38
    • 84984059530 scopus 로고
    • Kikuchi band contrast in diffraction patterns recorded by transmitted and backscattered electrons
    • Reimer L, Heilers U, Saliger G (1986) Kikuchi band contrast in diffraction patterns recorded by transmitted and backscattered electrons. Scanning 8:101-118
    • (1986) Scanning , vol.8 , pp. 101-118
    • Reimer, L.1    Heilers, U.2    Saliger, G.3
  • 42
    • 0000442972 scopus 로고
    • Large dynamic range, parallel detection system for electron diffraction and imaging
    • Spence J C H, Zuo JM (1988) Large dynamic range, parallel detection system for electron diffraction and imaging. Rev Sci Instrum 59(9):2102-2105
    • (1988) Rev Sci Instrum , vol.59 , Issue.9 , pp. 2102-2105
    • Spence, J.C.H.1    Zuo, J.M.2
  • 44
    • 0001257164 scopus 로고
    • Use of high-symmetry zone axes in electron diffraction in determining crystal point and space groups
    • Steeds JW, Vincent R (1983) Use of high-symmetry zone axes in electron diffraction in determining crystal point and space groups. J Appl Cryst 16:317-324
    • (1983) J Appl Cryst , vol.16 , pp. 317-324
    • Steeds, J.W.1    Vincent, R.2
  • 45
    • 0016729584 scopus 로고
    • A distortion-free map for use with electron channelling patterns
    • Stott DE, Wise M L H, Hutchinson WB (1975) A distortion-free map for use with electron channelling patterns. J Microsc 105:305-307
    • (1975) J Microsc , vol.105 , pp. 305-307
    • Stott, D.E.1    Wise, M.L.H.2    Hutchinson, W.B.3
  • 47
    • 84892362330 scopus 로고    scopus 로고
    • Accuracy assessment of elastic strain measurement by EBSD
    • in press
    • Villert S, Maurice C, Wyona C, Fortunier R (2008) Accuracy assessment of elastic strain measurement by EBSD. J Microsc in press
    • (2008) J Microsc
    • Villert, S.1    Maurice, C.2    Wyona, C.3    Fortunier, R.4
  • 49
    • 33344475405 scopus 로고    scopus 로고
    • High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity
    • Wilkinson AJ, Meaden G, Dingley DJ (2006) High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity. Ultramicroscopy 106:307-313
    • (2006) Ultramicroscopy , vol.106 , pp. 307-313
    • Wilkinson, A.J.1    Meaden, G.2    Dingley, D.J.3
  • 51
    • 53249130756 scopus 로고    scopus 로고
    • Dynamical effects of anisotropic inelastic scattering in electron backscatter diffraction
    • Winkelmann A (2008) Dynamical effects of anisotropic inelastic scattering in electron backscatter diffraction. Ultramicroscopy 108:1546-1550
    • (2008) Ultramicroscopy , vol.108 , pp. 1546-1550
    • Winkelmann, A.1
  • 52
    • 2442641903 scopus 로고    scopus 로고
    • Electron diffraction methods for the analysis of silicon carbide surfaces and the controlled growth of polytype heterostructures
    • Winkelmann A, Schröter B, Richter W (2004) Electron diffraction methods for the analysis of silicon carbide surfaces and the controlled growth of polytype heterostructures. J Phys-Condens Mat 16:S1555-S1578
    • (2004) J Phys-condens Mat , vol.16
    • Winkelmann, A.1    Schröter, B.2    Richter, W.3
  • 53
  • 54
    • 0004220095 scopus 로고
    • 3rd ed. IEEE Computer Society Press, New York, ISBN 0-8186-8944-7
    • Wolberg G (1992) Digital image warping, 3rd ed. IEEE Computer Society Press, New York, ISBN 0-8186-8944-7
    • (1992) Digital Image Warping
    • Wolberg, G.1
  • 55
    • 51249163030 scopus 로고
    • Automatic analysis of electron backscatter diffraction patterns
    • Wright SI, Adams BL (1992) Automatic analysis of electron backscatter diffraction patterns. Metall Trans 23 A: 759-767
    • (1992) Metall Trans , vol.23 A , pp. 759-767
    • Wright, S.I.1    Adams, B.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.