SCOPUS 정보 검색 플랫폼

Journal of Sol-Gel Science and Technology

Volumn 58, Issue 3, 2011, Pages 669-676

Effect of sol temperature on the structure, morphology, optical and photoluminescence properties of nanocrystalline zirconia thin films

(6) John Berlin, I a Lakshmi, J S a Sujatha Lekshmy, S a Daniel, Georgi P a Thomas, P V a Joy, K a

a MAR IVANIOS COLLEGE (India)

Author keywords

Atomic force microscopy (AFM); Photoluminescence; Sol temperature; Thin films; X ray diffraction (XRD); Zirconia

Indexed keywords

ANNEALING TEMPERATURES; DEFECT STATE; ENERGY BANDGAPS; GRAIN SIZE; INTENSE BANDS; LATTICE DISTORTIONS; MIXED PHASE; NANOCRYSTALLINE ZIRCONIA; OPTICAL QUALITIES; OPTICAL SPECTRA; PHASE TRANSFORMATION; PHOTOLUMINESCENCE PROPERTIES; PHOTOLUMINESCENCE SPECTRUM; PL INTENSITY; QUARTZ SUBSTRATE; RMS ROUGHNESS; ROOM TEMPERATURE; SOL-GEL DIP COATING TECHNIQUE; SOURCE MATERIAL; TETRAGONAL PHASE; TRANSMITTANCE SPECTRA; VALANCE BANDS; X-RAY DIFFRACTION (XRD); ZIRCONIUM OXYCHLORIDE;

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; DIFFRACTION; NANOCRYSTALLINE POWDERS; PHOTOLUMINESCENCE; QUARTZ; SOLS; THIN FILMS; X RAY DIFFRACTION; ZIRCONIA; ZIRCONIUM; ZIRCONIUM ALLOYS;

OPTICAL FILMS;

EID: 79958774873 PISSN: 09280707 EISSN: None Source Type: Journal
DOI: 10.1007/s10971-011-2443-6 Document Type: Article

Times cited : (33)

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