Structural and electrical properties of perovskite ruthenate-based lead-free thick film resistors on alumina and LTCC

Journal of Materials Science: Materials in Electronics

Volumn 16, Issue 10, 2005, Pages 687-691

  Rane, Sunit ^a,b   Prudenziati, Maria ^b   Morten, B ^b   Golonka, L ^c   Dziedzic, A ^c  

^a CENTRE FOR MATERIALS FOR ELECTRONICS TECHNOLOGY C MET   (India)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^c WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CERAMIC MATERIALS; CRYSTAL MICROSTRUCTURE; ELECTRIC PROPERTIES; ENERGY DISPERSIVE SPECTROSCOPY; RESISTORS; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS; THICK FILMS; X RAY DIFFRACTION ANALYSIS;

LOW TEMPERATURE COFIRED CERAMIC (LTCC); PEROVSKITE RUTHENATE BASED LEAD FREE THICK FILM RESISTORS;

PEROVSKITE;

EID: 27244447061     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-005-3747-5     Document Type: Article

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