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Volumn 58, Issue 2, 1997, Pages 159-164

Piezoresistive properties of RuO2-based thick-film resistors: The effect of RuO2 grain size

Author keywords

Piezoresistive properties; Ruthenium dioxide; Thick film resistors

Indexed keywords

GRAIN SIZE AND SHAPE; PIEZOELECTRICITY; RUTHENIUM COMPOUNDS; SENSORS; THICK FILM DEVICES;

EID: 0031060757     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(96)01407-0     Document Type: Article
Times cited : (48)

References (17)
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  • 4
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    • Part 1 in May issue, p. 45, Part 2 in June issue
    • S. Chitale, C. Huang and M. Stein, High gauge factor thick film resistors for strain gauges, Hybrid Circuit Technol., 6 (1989): Part 1 in May issue, p. 45, Part 2 in June issue, p. 45.
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    • Chitale, S.1    Huang, C.2    Stein, M.3
  • 6
    • 0023420596 scopus 로고
    • A new model for electron movement in a thick film resistor and its application to analysis of the structure and conduction mechanism in these resistors
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    • (1987) Thin Solid Films , vol.152 , pp. 487-497
    • Winkler, E.M.1    Steenvoorden, G.K.2
  • 7
    • 84986361465 scopus 로고
    • A model describing piezoresistive effects in thick film resistors
    • S. Paszczynski, A model describing piezoresistive effects in thick film resistors, Rozprawy Elekrotech., 35 (1989) 645-671.
    • (1989) Rozprawy Elekrotech. , vol.35 , pp. 645-671
    • Paszczynski, S.1
  • 9
    • 0002090612 scopus 로고
    • Piezoresistive properties of thick-film resistors: An overview
    • M. Prudenziati and B. Morten, Piezoresistive properties of thick-film resistors: an overview, Hybrid Circuits, 10 (1986) 20-25.
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    • Prudenziati, M.1    Morten, B.2
  • 11
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    • Very high strain sensitivity in thick film resistors: Real and false super gauge factors
    • M. Prudenziati, B. Morten, F. Cilloni and G. Ruffi, Very high strain sensitivity in thick film resistors: real and false super gauge factors, Sensors and Actuators, 19 (1989) 401-414.
    • (1989) Sensors and Actuators , vol.19 , pp. 401-414
    • Prudenziati, M.1    Morten, B.2    Cilloni, F.3    Ruffi, G.4
  • 12
    • 0029358230 scopus 로고
    • Correlation between microstructure and gauge factors in thick film resistors
    • M. Hrovat, G. Drazic, J. Hole and D. Belavic, Correlation between microstructure and gauge factors in thick film resistors, J. Mater. Sci. Lett., 14 (1995) 1048-1051.
    • (1995) J. Mater. Sci. Lett. , vol.14 , pp. 1048-1051
    • Hrovat, M.1    Drazic, G.2    Hole, J.3    Belavic, D.4
  • 14
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    • Absorption of gases in multimolecular layers
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.