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Volumn 82, Issue 5, 2011, Pages

The FAST module: An add-on unit for driving commercial scanning probe microscopes at video rate and beyond

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL ELECTRONICS; FAST ACQUISITION; FAST SCANNING; FRAME RATE; HIGH SPEED SCANNING; HIGH-RESOLUTION IMAGING; NON-INVASIVE; SCANNING FREQUENCY; SCANNING PROBE INSTRUMENT; SCANNING PROBE MICROSCOPE; SCANNING TUNNELING MICROSCOPES; SIGNAL ACQUISITIONS; SLOW MODE; TECHNICAL SOLUTIONS; VIDEO RATES; VIDEO-RATE IMAGES;

EID: 79958069670     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3585984     Document Type: Article
Times cited : (35)

References (19)
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  • 10
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    • A mechanical microscope: High-speed atomic force microscopy
    • DOI 10.1063/1.1855407, 034106
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    • Humphris, A.D.L.1    Miles, M.J.2    Hobbs, J.K.3
  • 12
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    • In-situ atomic-scale studies of the mechanisms and dynamics of metal dissolution by high-speed STM
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  • 18
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    • This I/V converter works with respect to ground: at variance with the standard configuration for an Omicron VT-STM, in our setuthe gavoltage was therefore applied to the sample
    • This I/V converter works with respect to ground: at variance with the standard configuration for an Omicron VT-STM, in our setup the gap voltage was therefore applied to the sample.
  • 19
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    • Scanning tunnelling microscopy investigations of simple surface reactions on Rh(110)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.