Pushing the limits of SPM

Materials Today

Volumn 8, Issue 5, 2005, Pages 20-25

  Frenken, Joost W M ^a   Oosterkamp, Tjerk H ^a   Hendriksen, Bas L M ^a   Rost, Marcel J ^a,b  

^a LEIDEN UNIVERSITY   (Netherlands)

^b Leiden Probe Microscopy BV   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRODES; ERROR ANALYSIS; IMAGING TECHNIQUES; NANOSTRUCTURED MATERIALS; PROTEINS; SCANNING TUNNELING MICROSCOPY; SIGNAL TO NOISE RATIO; SINGLE CRYSTALS; SPECTROSCOPIC ANALYSIS; STATISTICAL METHODS;

HIGH-SPEED IMAGING; HIGHLY IDEALIZED CONDITIONS; SCANNING PROBE MICROSCOPES (SPM); SPECTROSCOPIC INFORMATION;

MICROSCOPIC EXAMINATION;

EID: 17644422787     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(05)00842-4     Document Type: Article

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