Three dimensional analyses of flux pinning centers in Dy-doped YBa2Cu3O7-x coated superconductors by STEM tomography

Physica C: Superconductivity and its Applications

Volumn 469, Issue 23-24, 2009, Pages 2052-2059

  Ortalan, V ^a   Herrera, M ^a   Rupich, M W ^b   Browning, N D ^a,c  

^a University of California   (United States)

^b AMERICAN SUPERCONDUCTOR CORPORATION   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Coated superconductors; Electron tomography; Flux pinning; Scanning transmission electron microscopy

Indexed keywords

AVERAGE SIZE; CHEMICAL DOPING; COATED CONDUCTORS; COATED SUPERCONDUCTOR; COATED SUPERCONDUCTORS; DISTRIBUTION UNIFORMITY; ELECTRON TOMOGRAPHY; FLUX PINNING CENTERS; HIGH DENSITY; LARGE PARTICLES; METAL ORGANIC DECOMPOSITION; PINNING CENTER; SAMPLE VOLUME; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SECONDARY PHASE; STRUCTURAL DEFECT; SUPERCONDUCTIVE PROPERTIES; THREE-DIMENSIONAL ANALYSIS; TIME PARAMETER; TOMOGRAPHIC; TWIN BOUNDARIES; UNIFORM SIZE;

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DECOMPOSITION; DOPING (ADDITIVES); ELECTRIC FIELD MEASUREMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRON MICROSCOPES; ELECTRONS; HIGH TEMPERATURE SUPERCONDUCTORS; NANOPARTICLES; ORGANOMETALLICS; PARTICLE SIZE; POINT DEFECTS; SCANNING; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTIVITY; THREE DIMENSIONAL; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

FLUX PINNING;

EID: 70449509983     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2009.08.012     Document Type: Article

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