High-resolution transmission electron microscopy observations of La 2Zr207 thin layers on LaA10^ obtained by chemical methods

Journal of Materials Research

Volumn 24, Issue 4, 2009, Pages 1480-1491

  Rapenne, L ^a   Jimenez C ^a   Caroff, T ^a,b   Millon, C ^a,b   Morlens, S ^b   Bayle Guillemaud, P ^c   Weiss , F ^a  

^a LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE   (France)

^b UPS2070 ^*  (France)

^c CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER LAYERS FOR COATED CONDUCTORS; CHEMICAL METHODS; COATED CONDUCTORS; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPIES; LOCAL DISTRIBUTIONS; METAL-ORGANIC CHEMICAL VAPOR DEPOSITIONS; METAL-ORGANIC DECOMPOSITIONS; NANO-VOIDS; OXYGEN DIFFUSIONS; PYROCHLORE; PYROCHLORE PHASE; PYROCHLORE STRUCTURES; SINGLE-CRYSTAL STRUCTURES; THIN LAYERS; X- RAY DIFFRACTIONS;

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL STRUCTURE; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; EPITAXIAL LAYERS; LANTHANUM; OXYGEN; ZIRCONIUM;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 65349087396     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0162     Document Type: Article

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