Simplified procedure for estimating epitaxy of la2zr 2o7-buffered niw rabits using xrd

IEEE Transactions on Applied Superconductivity

Volumn 19, Issue 3, 2009, Pages 3307-3310

  Rikel, Mark O ^a   Isfort, Dirk ^a   Klein, Marcel ^a   Ehrenberg, Jiirgen ^a   Bock, Joachim ^a   Specht, Elliot D ^b   Sun Wagener, Ming ^c   Weber, Oxana ^c   Sporn, Dieter ^c   Engel, Sebastian ^d   De Haas, Oliver ^d   Semerad, Robert ^e   Schubert, Margitta ^f   Holzapfel, Bernhard ^f  

^a Nexans Superconductors   (Germany)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c Silicatforschung ISC   (Germany)

^d evico GmbH   (Germany)

^e THEVA DÜNNSCHICHTTECHNIK GMBH   (Germany)

^f IFW DRESDEN   (Germany)

Author keywords

Epitaxial layers; Quality control; X ray measurements

Indexed keywords

CONDUCTOR ARCHITECTURES; POLYCRYSTALLINE; REFLECTOMETRY MEASUREMENTS; ROCKING CURVES; SIMPLIFIED PROCEDURE; STANDARD SAMPLES; THERMAL CO-EVAPORATION; X-RAY MEASUREMENTS; XRD; XRD PATTERNS; YBCO LAYER;

CRYSTAL GROWTH; EPITAXIAL FILMS; EPITAXIAL LAYERS; MOLECULAR BEAM EPITAXY; PELLETIZING; QUALITY ASSURANCE; QUALITY FUNCTION DEPLOYMENT; TOTAL QUALITY MANAGEMENT; YTTRIUM BARIUM COPPER OXIDES; ZIRCONIUM;

QUALITY CONTROL;

EID: 68649095603     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2009.2017907     Document Type: Conference Paper

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