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Volumn 80, Issue 7, 2002, Pages 1141-1143
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Spatially resolved cathodoluminescence of laterally overgrown GaN pyramids on (111) silicon substrate: Strong correlation between structural and optical properties
a
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Author keywords
[No Author keywords available]
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Indexed keywords
BAND EDGE;
CATHODOLUMINESCENCE SPECTROSCOPY;
EMISSION INTENSITY;
GAN PYRAMIDS;
HEXAGONAL PYRAMIDS;
MAPPING TECHNIQUES;
MICROSCOPIC IMAGE;
MICROSCOPIC TECHNIQUES;
SI SUBSTRATES;
SILICON SUBSTRATES;
SPATIALLY RESOLVED;
SPATIALLY RESOLVED OPTICAL EMISSION;
STRONG CORRELATION;
STRUCTURAL AND OPTICAL PROPERTIES;
STRUCTURAL DEFECT;
THREADING DISLOCATION DENSITIES;
TRANSMISSION ELECTRON;
CATHODOLUMINESCENCE;
EDGE DISLOCATIONS;
GALLIUM NITRIDE;
OPTICAL CORRELATION;
OPTICAL EMISSION SPECTROSCOPY;
SUBSTRATES;
OPTICAL PROPERTIES;
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EID: 79956001471
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1450250 Document Type: Article |
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Times cited : (16)
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References (16)
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