Infrared induced emission from silicon quantum wires

Solid-State Electronics

Volumn 42, Issue 7-8, 1998, Pages 1199-1204

  Bagraev, N T ^a   Chaikina, E I ^a   Gehlhoff, W ^b   Klyachkin, L E ^a   Markov, I I ^a   Malyarenko, A M ^a  

^a IOFFE INSTITUTE   (Russian Federation)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC DENSITY OF STATES; ELECTROSTATICS; INFRARED RADIATION; LIGHT EMISSION; SEMICONDUCTING SILICON; SEMICONDUCTOR JUNCTIONS;

INFRARED INDUCED EMISSION;

SEMICONDUCTOR QUANTUM WIRES;

EID: 0032115240     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00004-5     Document Type: Article

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