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Volumn 283, Issue 5-6, 1998, Pages 368-372

Transmission electron microscopy evidence of the defect structure in Si nanowires synthesized by laser ablation

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[No Author keywords available]

Indexed keywords


EID: 0032512517     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(97)01378-X     Document Type: Article
Times cited : (115)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.