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Volumn 283, Issue 5-6, 1998, Pages 368-372
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Transmission electron microscopy evidence of the defect structure in Si nanowires synthesized by laser ablation
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0032512517
PISSN: 00092614
EISSN: None
Source Type: Journal
DOI: 10.1016/S0009-2614(97)01378-X Document Type: Article |
Times cited : (115)
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References (15)
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