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Volumn 3, Issue 3, 2011, Pages 836-841

Soluble fullerene-based n-channel organic thin-film transistors printed by using a polydimethylsiloxane stamp

Author keywords

complementary inverter; n channelmaterial; organic field effect transistor; organic semiconductor; polydimethylsiloxane Stamp; self assembled monolayer; soluble fullerene derivative; transfer printing

Indexed keywords

COMPLEMENTARY INVERTERS; N-CHANNELMATERIAL; ORGANIC SEMICONDUCTOR; POLYDIMETHYLSILOXANE STAMP; SOLUBLE FULLERENE DERIVATIVE; TRANSFER PRINTING;

EID: 79955968802     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am101193y     Document Type: Article
Times cited : (8)

References (55)
  • 30
    • 84857710165 scopus 로고    scopus 로고
    • In this paper, we use a term -Jstamping- instead of -JμCP-, as we used a flat PDMS stamp without micrometer-sized projection patterns. The process is essentially same as μCP. For our complementary inverter fabrication, two different semiconductor materials are transferred sequentially onto a same substrate using PDMS stamps whose size is much smaller than that of the substrate.
    • In this paper, we use a term -Jstamping-J instead of -J-μCP-J, as we used a flat PDMS stamp without micrometer-sized projection patterns. The process is essentially same as μCP. For our complementary inverter fabrication, two different semiconductor materials are transferred sequentially onto a same substrate using PDMS stamps whose size is much smaller than that of the substrate.
  • 42
    • 84857769812 scopus 로고    scopus 로고
    • Only one diffraction peak was observed for the stamped C60MC12 films in Figure 2 f, whereas higher-order peaks were observed for the spin-coated films in our previous study (ref 31). This is due to the differences in fabrication conditions such as the size of the C60MC12 films and the spinning time.
    • Only one diffraction peak was observed for the stamped C60MC12 films in Figure 2 f, whereas higher-order peaks were observed for the spin-coated films in our previous study (ref 31). This is due to the differences in fabrication conditions such as the size of the C60MC12 films and the spinning time
  • 47
    • 84857771739 scopus 로고    scopus 로고
    • The device with the PFOTS-treated insulator had a higher threshold voltage and a lower mobility than those of the device with the untreated insulator. These results are interpreted to be due to negative partial charge on the fluorine terminal of the SAM, which suppresses charge accumulation for carrier transport in the channel
    • The device with the PFOTS-treated insulator had a higher threshold voltage and a lower mobility than those of the device with the untreated insulator. These results are interpreted to be due to negative partial charge on the fluorine terminal of the SAM, which suppresses charge accumulation for carrier transport in the channel.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.