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Volumn 115, Issue 16, 2011, Pages 7956-7966

Global and local oxidation behavior of reduced graphene oxide

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED BIAS VOLTAGE; BASAL PLANES; CARBON MATERIAL; DEFECT-FREE; DEFECTIVE STRUCTURES; ELECTRONIC ORIGIN; LOCAL OXIDATION; MORPHOLOGICAL EVOLUTION; OXIDATIVE ATTACK; OXYGEN FUNCTIONAL GROUPS; OXYGEN GROUPS; OXYGEN PLASMAS; SCANNING TUNNELING MICROSCOPY (STM); STM IMAGES; STM LITHOGRAPHY; THERMAL OXIDATION;

EID: 79955423286     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp2003744     Document Type: Article
Times cited : (38)

References (72)
  • 2
    • 67649225738 scopus 로고    scopus 로고
    • Geim, A. K. Science 2009, 324, 1530-1534
    • (2009) Science , vol.324 , pp. 1530-1534
    • Geim, A.K.1
  • 25
    • 17844377306 scopus 로고    scopus 로고
    • Hahn, J. R. Carbon 2005, 43, 1506-1511
    • (2005) Carbon , vol.43 , pp. 1506-1511
    • Hahn, J.R.1
  • 48
    • 0027663543 scopus 로고
    • Haddon, R. C. Science 1993, 261, 1545-1550
    • (1993) Science , vol.261 , pp. 1545-1550
    • Haddon, R.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.