Tailoring graphite layers by scanning tunneling microscopy

Applied Surface Science

Volumn 222, Issue 1-4, 2004, Pages 374-381

  Hiura, Hidefumi ^a,b  

^a NEC CORPORATION   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Graphite; Oxidation; Scanning tunneling microscopy; Surface chemical reaction

Indexed keywords

ACTIVATION ENERGY; ADSORPTION; ATMOSPHERIC PRESSURE; ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; ELECTRIC FIELD EFFECTS; OXIDATION; SCANNING TUNNELING MICROSCOPY; SURFACE REACTIONS; SURFACE STRUCTURE; THRESHOLD VOLTAGE;

EXFOLIATION; HYBRIDIZATION;

GRAPHITE;

EID: 0346753479     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2003.09.004     Document Type: Article

References (13)

1. Hiura H., Ebbesen T.W., Fujita J., Tanigaki K., Takada T. Nature. 367:1994;148.
2. Ebbesen T.W., Hiura H. Adv. Mater. 7:1995;582.
3. Hiura H. J. Mater. Res. 16:2001;1287.
4. Fujita M., Wakabayashi K., Nakada K., Kusakabe K. J. Phys. Soc. Jpn. 65:1996;1920.
5. Nakada K., Fujita M., Dresselhaus G., Dresselhaus M.S. Phys. Rev. B. 54:1996;17954.
6. Ebbesen T.W., Ajayan P.M. Nature. 358:1992;220.
7. Kondo S., Lutwyche M., Wada Y. Appl. Surf. Sci. 75:1994;39.
8. Albrecht T.R., Dovek M.M., Kirk M.D., Lang C.A., Quate C.F., Smith D.P.E. Appl. Phys. Lett. 55:1989;1727.
9. Mizutani W., Inukai J., Ono M. Jpn. J. Appl. Phys. 29:1990;L815.
10. Abe T., Hane K., Okuma S. J. Appl. Phys. 75:1994;1228.
11. T.T. Tsong (Ed.), Atom-Probe Field Ion Microscopy, Field Ion Emission and Surfaces and Interfaces at Atomic Resolution, Cambridge University Press, Cambridge, 1990, Chapter 2, and the references therein.
12. P.L. Walker Jr., et al., in: D.D. Eley, P.W. Selwood, P.B. Weisz (Eds.), Advances in Catalysis and Related Subjects, vol. 11, Academic Press, New York, 1959, p. 133.
13. Tsong T.T., Chang C.-S. Jpn. J. Appl. Phys. 34:1995;3309.