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Volumn 109, Issue 7, 2011, Pages

Raman analysis of three-dimensionally graded stress tensor components in sapphire

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGING EFFECT; BACK-SCATTERED; CRYSTALLOGRAPHIC DIRECTIONS; CRYSTALLOGRAPHIC ORIENTATIONS; EULER TRANSFORMATION MATRICES; EXPERIMENTAL KNOWLEDGE; FREQUENCY SHIFT; IMPROVED METHODS; MATRIX; MICRO-PROBES; MULTIAXIAL STRESS; MULTIAXIAL STRESS STATE; POLARIZED RAMAN; RAMAN ANALYSIS; RAMAN BANDS; SECULAR EQUATIONS; SPECTRAL SHIFT; STEEP GRADIENTS; STRESS COMPONENT; STRESS FIELD; STRESS TENSORS; SYSTEM OF LINEAR EQUATIONS; TENSOR COMPONENTS; UNIAXIAL STRESS;

EID: 79955417191     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3559871     Document Type: Conference Paper
Times cited : (31)

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