Spatially resolved piezo-spectroscopic characterizations for the validation of theoretical models of notch-root stress fields in ceramic materials

Continuum Mechanics and Thermodynamics

Volumn 20, Issue 3, 2008, Pages 123-132

  Munisso, Maria Chiara ^a   Yano, Satomi ^a   Zhu, Wenliang ^a   Pezzotti, Giuseppe ^a  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Cathodoluminescence; Notch root; Photoluminescence; Ruby; Stress

Indexed keywords

(ABIOTIC AND BIOTIC) STRESS; BRITTLE MATERIALS; ELECTRON-STIMULATED LUMINESCENCE (ESL); EXPERIMENTAL ASSESSMENT; EXPERIMENTAL DATA; LATTICE STRAINS; LOCAL STRESSES; MAXIMUM STRESS; RUBY CRYSTAL; SINGLE-CRYSTALLINE; SPATIALLY RESOLVED; SPECTRAL SHIFTING; SPECTROSCOPIC CHARACTERIZATIONS; SPRINGER (CO); STRESS FIELDS;

CERAMIC MATERIALS; LIGHT EMISSION; LIGHT SOURCES; LUMINESCENCE; MAPS; RADIATION; RUBY; SOLUTIONS;

STRESSES;

EID: 47749090934     PISSN: 09351175     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00161-008-0074-0     Document Type: Article

References (34)

1. Neuber H. (1961). Theory of stress concentration for shear strained prismatical bodies with arbitrary nonlinear stress-strain law. J. Appl. Mech. 28: 544-550
2. Glinka G. and Molski K. (1981). A method of elastic-plastic stress and strain calculation at a notch root. Mater. Sci. Eng. 50: 93-100
3. Topper T.H., Wetzel R.M. and Morrow J. (1969). Neuber's rule applied to fatigue of notched specimens. J. Mater. 4: 200-209
4. Gemma A.E. (1985). An approximate elasto-plastic analysis of the effect of plain strain at the surface of a notch. Eng. Fract. Mech. 21: 495-501
5. Hoffman M. and Seeger T. (1985). A generalized method for estimating multiaxial elastic-plastic notch stresses and strains, parts 1 and 2. J. Eng. Mater. Tech. 107: 250-260
6. Glinka G. (1985). Calculation of inelastic notch-tip strain-stress histories under cyclic loadings. Eng. Fract. Mech. 22: 839-854
7. Moftahar A., Buczynski A. and Glinka G. (1995). Calculation of elasto-plastic strains and stresses in notches multiaxial loading. Int. J. Fract. 70: 357-373
8. Singh M.N.K., Glinka G. and Dubey R.N. (1996). Elastic-plastic stress-strain calculation in notched bodies subjected to non-proportional loading. Int. J. Fract. 76: 39-60
9. Creager M. and Paris P.C. (1967). Elastic field equations for blunt cracks with reference to stress-corrosion cracking. Int. J. Fract. Mech. 3: 247-252
10. 1 fluorescence pressure gauge from 0.06 to 1 Mbar. J. Appl. Phys. 49: 3276-3283
11. Xu J., Mao H.K. and Bell P.M. (1986). High pressure ruby and diamond fluorescence: observations at 0.21 to 0.55 terapascal. Science 232: 1404-1406
12. 3. Science 278: 1109-1111
13. Urtiew P.A. (1974). Effect of shock loading on transparency of sapphire crystals. J. Appl. Phys. 45: 3490-3493
14. Nellis W.J. and Yoo C.S. (1990). Issues concerning shock temperature measurements of iron and other metals. J. Geophys. Res. 95: 21749-21752
15. McQueen R.G. and Isaak D.G. (1990). Characterizing windows for shock wave radiation studies. J. Geophys. Res. 95: 21753-21765
16. 3. J. Appl. Phys. 49: 580
17. Lipkin D.M. and Clarke D.R. (1996). Measurements of the stress in oxide scales formed by oxidation of alumina-forming alloys. Oxid. Met. 45: 267-280
18. Ma Q. and Clarke D.R. (1994). Piezospectroscopic determination of residual stresses in polycrystalline alumina. J. Am. Ceram. Soc. 77: 298-302
19. He J. and Clarke D.R. (1995). Determination of the piezospectroscopic coefficients for chromium-doped sapphire. J. Am. Ceram. Soc. 78: 1347-1353
20. Molis S.E. and Clarke D.R. (1990). Measurement of stresses using fluorescence in an optical microprobe: stresses around indentations in a chromium-doped sapphire. J. Am. Ceram. Soc. 73: 3189-3194
21. Ma Q. and Clarke D.R. (1993). Stress measurement in single-crystal and polycrystalline ceramics using their optical fluorescence. J. Am. Ceram. Soc. 76: 1433-1440
22. Ma Q., Liang L.C., Clarke D.R. and Hutchinson J.W. (1994). Mechanics of the push-out process from in situ measurement of the stress distribution along embedded sapphire fibers. Acta Metall. Mater. 42: 3299-3308
23. Sergo V., Clarke D.R. and Pompe W. (1995). Deformation bands in ceria-stabilized tetragonal zirconia/alumina: I measurement of internal stresses. J. Am. Ceram. Soc. 78: 633-640
24. Vos W.L. and Schouten J.A. (1991). On the temperature correction to the ruby pressure scale. J. Appl. Phys. 69: 6744-6746
25. 3 ceramic for residual stress measurements. J. Mater. Res. 10: 2817-2822
26. Sergo, V.: Measurements of residual stresses. In: Meriani, S., Sergo, V. (eds.) Proceedings of FOURTH EUROCERAMICS. Basic Science-Optimization of properties and Performances by Improved Design and Microstructure Control, vol. 3. pp. 47-54 (1995)
27. Gomez F.J. and Elices M. (2004). Criterion for blunted V-notched samples. Int. J. Fract. 127: 239-264
28. Munisso M.C., Zhu W. and Pezzotti G. (2007). Stress dependence of sapphire cathodoluminescence from optically active oxygen defects as a function of crystallographic orientation. J. Phys. Chem. A 11: 3526-3533
29. Filippi S., Lazzarin P. and Tovo R. (2002). Developments of some explicit formulas useful to describe elastic stress fields ahead of notches in plates. Int. J. Solids Struct. 39: 4543-4565
30. Evans, A.G.: Fracture mechanics determinations. In: Bradt, R.C., Hasselman, D.P.H., Lange, F.F. (eds.) Fracture Mechanics of Ceramics. Concepts, Flaws, and Fractography, vol.1, pp. 17-47. Plenum Press, New York (1973)
31. Zhu W., Wan K. and Pezzotti G. (2006). Methods of piezo-spectroscopic calibration of thin-film materials: I Ball-on-ring biaxial flexure. Meas. Sci. Technol. 17: 191-198
32. Zhu W., Porporati A.A., Matsutani A., Lama N. and Pezzotti G. (2007). Spatially resolved crack-tip stress analysis in semiconductor by cathodoluminescence piezo-spectroscopy. J. Appl. Phys. 101: 103531-103543
33. 3/3Y-TZP multilayered composite using confocal fluorescence spectroscopy. Appl. Spectr. 59: 1042-1048
34. Pezzotti G., Zhu W., Leto A., Matsutani A. and Porporati A.A. (2006). Electron probe response function and piezo-spectroscopic behavior of semiconductor materials in presence of highly graded stress fields. J. Phys. D 39: 4975-4986