Confocal Raman microspectroscopy through a planar interface

Applied Spectroscopy

Volumn 55, Issue 5, 2001, Pages 517-524

  Baldwin, K J ^a   Batchelder, D N ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

Confocal Raman; Depth of focus; Scattering volume

Indexed keywords

ABERRATIONS; DEGRADATION; FOCUSING; INTERFACES (MATERIALS); LASER BEAMS; MATHEMATICAL MODELS; OPTIMIZATION; REFRACTION; STRESS CONCENTRATION;

CONFOCAL RAMAN MICROSPECTROSCOPY; PLANAR INTERFACE; SPHERICAL ABERRATION;

RAMAN SPECTROSCOPY;

EID: 0035332307     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702011952190     Document Type: Article

References (8)