|
Volumn 82, Issue 5, 1997, Pages 2595-2602
|
Determination of unknown stress states in silicon wafers using microlaser Raman spectroscopy
|
Author keywords
[No Author keywords available]
|
Indexed keywords
LASER BEAM EFFECTS;
LIGHT POLARIZATION;
LIGHT SCATTERING;
MATHEMATICAL MODELS;
MATHEMATICAL TRANSFORMATIONS;
MATRIX ALGEBRA;
RAMAN SPECTROSCOPY;
STRESSES;
MICROLASER RAMAN SPECTROSCOPY;
PLANE STRESS COMPONENTS;
SILICON WAFERS;
|
EID: 0031237190
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.366072 Document Type: Article |
Times cited : (86)
|
References (20)
|