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Volumn 22, Issue 22, 2011, Pages

High-throughput optical quality control of lipid multilayers fabricated by dip-pen nanolithography

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CALIBRATION PARAMETERS; D LINES; DIP-PEN NANOLITHOGRAPHY; FABRICATION METHOD; FLUORESCENCE INTENSITIES; FLUORESCENCE MICROSCOPES; FUNCTION RELATIONSHIPS; HEIGHT MEASUREMENT; HIGH-THROUGHPUT; LARGE SURFACE AREA; LIPID MULTILAYERS; LITHOGRAPHIC PROCESS; OPTICAL CHARACTERIZATION; OPTICAL DIFFRACTION LIMIT; OPTICAL METHODS; OPTICAL QUALITY CONTROL; OPTICAL SCATTERING; PROMISING MATERIALS; SELF-ORGANIZE; STRUCTURED LIPIDS;

EID: 79954519608     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/22/225301     Document Type: Article
Times cited : (23)

References (61)
  • 4
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    • Eggeling C et al 2009 Nature 457 1159
    • (2009) Nature , vol.457 , Issue.7233 , pp. 1159
    • Eggeling, C.1
  • 21
    • 55349114734 scopus 로고    scopus 로고
    • Sekula S et al 2008 Small 4 1785
    • (2008) Small , vol.4 , Issue.10 , pp. 1785
    • Sekula, S.1
  • 53
    • 79954534802 scopus 로고    scopus 로고
    • Avanti Polar Lipids Inc., Alabaster, AL
    • www.avantilipids.com (Avanti Polar Lipids Inc., Alabaster, AL)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.