Post-Annealing effects on the structural and the optical properties of ZnO thin films grown by using the hydrothermal method

Journal of the Korean Physical Society

Volumn 58, Issue 3, 2011, Pages 515-519

  Kim, Min Su ^a   Yim, Kwang Gug ^a   Cho, Min Young ^a   Leem, Jae Young ^a   Lee, Dong Yul ^b   Kim, Jin Soo ^c   Kim, Jong Su ^d   Son, Jeong Sik ^e  

^a Inje University   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c Chonbuk National University   (South Korea)

^d Yeungnam University   (South Korea)

^e Kyungwoon University   (South Korea)

Author keywords

Atomic force microscopy; Hydrothermal; Scanning electron microscopy; X ray diffraction; Zinc oxide

Indexed keywords

EID: 79952822648     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.58.515     Document Type: Article

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