Effects of growth temperature of MBE-seed layers on the structural and optical properties of ZnO thin films prepared by using the sol-gel method

Journal of the Korean Physical Society

Volumn 56, Issue 5, 2010, Pages 1514-1518

  Choi, Hyun Young ^a   Kim, Min Su ^a   Cho, Min Young ^a   Kim, Ghun Sik ^a   Jeon, Su Min ^a   Yim, Kwang Gug ^a   Kim, Do Yeob ^a   Ryu, Hyuk Hyun ^a   Leem, Jae Young ^a   Lee, Dong Yul ^b   Kim, Jin Soo ^c   Kim, Jong Su ^d   Son, Jeong Sik ^e   Lee, Joo In ^f  

^a Inje University   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c Chonbuk National University   (South Korea)

^d Yeungnam University   (South Korea)

^e Kyungwoon University   (South Korea)

^f Korea Research Institute of Standards and Science   (South Korea)

Author keywords

Atomic force microscopy; Photoluminescence; Scanning electron microscopy; Sol gel method; X ray diffraction; Zinc oxide

Indexed keywords

EID: 77954851453     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.56.1514     Document Type: Article

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