-
2
-
-
0024732785
-
Microrobots and micromechanical systems
-
Trimmer W S N 1989 Microrobots and micromechanical systems Sensors Actuators 19 267-87.
-
(1989)
Sensors Actuators
, vol.19
, pp. 267-287
-
-
Trimmer, W.S.N.1
-
3
-
-
0031146236
-
Fabrication and characterization of cantilevers with integrated sharp tips and piezoelectric elements for actuation and detection for parallel AFM applications
-
Indermuhle P F, Schurmann G, Racine G A and Rooij N F 1997 Fabrication and characterization of cantilevers with integrated sharp tips and piezoelectric elements for actuation and detection for parallel AFM applications Sensors Actuators A 60 186-90.
-
(1997)
Sensors Actuators A
, vol.60
, pp. 186-190
-
-
Indermuhle, P.F.1
Schurmann, G.2
Racine, G.A.3
Rooij, N.F.4
-
4
-
-
0031141922
-
Fabrication of improved piezoresistive silicon cantilevers probes for the atomic force microscope
-
Su Y, Evans A G R, Brunnschweiler A, Ensell G and Koch M 1997 Fabrication of improved piezoresistive silicon cantilevers probes for the atomic force microscope Sensors Actuators A 60 163-7.
-
(1997)
Sensors Actuators A
, vol.60
, pp. 163-167
-
-
Su, Y.1
Evans, A.G.R.2
Brunnschweiler, A.3
Ensell, G.4
Koch, M.5
-
5
-
-
0032636832
-
Microfabricated ultrasensitive piezoresistive cantilevers for torque magnetometry
-
Brugger J, Despont M, Rossel C, Rothuizen H, Vettiger P and Willemin M 1999 Microfabricated ultrasensitive piezoresistive cantilevers for torque magnetometry Sensors Actuators A 73 235-42.
-
(1999)
Sensors Actuators A
, vol.73
, pp. 235-242
-
-
Brugger, J.1
Despont, M.2
Rossel, C.3
Rothuizen, H.4
Vettiger, P.5
Willemin, M.6
-
6
-
-
0031655234
-
Piezoresistive sensors on AFM cantilevers with atomic resolution
-
Jumpertz R, Hart A, Ohlsson O, Saurenbach F and Schelten J 1998 Piezoresistive sensors on AFM cantilevers with atomic resolution Microelectron. Eng. 41-42 441-4.
-
(1998)
Microelectron. Eng
, vol.41-42
, pp. 441-444
-
-
Jumpertz, R.1
Hart, A.2
Ohlsson, O.3
Saurenbach, F.4
Schelten, J.5
-
7
-
-
36149006772
-
The effect of homogeneous mechanical stress on the electrical resistance of crystals
-
Bridgman P W 1932 The effect of homogeneous mechanical stress on the electrical resistance of crystals Phys. Rev. 42 858-63.
-
(1932)
Phys. Rev
, vol.42
, pp. 858-863
-
-
Bridgman, P.W.1
-
9
-
-
0020127035
-
Silicon as a mechanical material
-
Peterson K 1982 Silicon as a mechanical material Proc. IEEE 5 420-57.
-
(1982)
Proc. IEEE
, vol.5
, pp. 420-457
-
-
Peterson, K.1
-
11
-
-
33846693940
-
Piezoresistance effect in germanium and silicon
-
Smith C S 1954 Piezoresistance effect in germanium and silicon Phys. Rev. 94 42-9.
-
(1954)
Phys. Rev
, vol.94
, pp. 42-49
-
-
Smith, C.S.1
-
12
-
-
0347807129
-
1954 Elastoresistance in p-type Ge and Si
-
Adams E N 1954 Elastoresistance in p-type Ge and Si Phys. Rev. 96 803-4.
-
Phys. Rev
, vol.96
, pp. 803-804
-
-
Adams, E.N.1
-
13
-
-
0037187737
-
Doping effects on thermal behaviour of silicon resistor
-
Boukabache A and Pons P 2002 Doping effects on thermal behaviour of silicon resistor Electron. Lett. 38 342-3.
-
(2002)
Electron. Lett
, vol.38
, pp. 342-343
-
-
Boukabache, A.1
Pons, P.2
-
15
-
-
47849107906
-
Characterization of the temperature dependence of the piezoresistive coefficients of silicon from -150 ?C to +125 ?C
-
Cho C H, Jaeger R C and Suhling J C 2008 Characterization of the temperature dependence of the piezoresistive coefficients of silicon from -150 ?C to +125 ?C IEEE Sensors 8 1455-68.
-
(2008)
IEEE Sensors
, vol.8
, pp. 1455-1468
-
-
Cho, C.H.1
Jaeger, R.C.2
Suhling, J.C.3
-
16
-
-
47849107906
-
Characterization of the temperature dependence of the pressure coefficient of n- And p-type silicon using hydrostatic testing
-
Cho C H, Jaeger R C, Suhling J C, Kang Y and Mian A 2008 Characterization of the temperature dependence of the pressure coefficient of n- And p-type silicon using hydrostatic testing IEEE Sensors 8 1455-68.
-
(2008)
IEEE Sensors
, vol.8
, pp. 1455-1468
-
-
Cho, C.H.1
Jaeger, R.C.2
Suhling, J.C.3
Kang, Y.4
Mian, A.5
-
17
-
-
0019916789
-
A graphical representation of the piezoresistance coefficients in silicon
-
Kanda Y 1982 A graphical representation of the piezoresistance coefficients in silicon IEEE Trans. Electron Devices 29 64-70.
-
(1982)
IEEE Trans. Electron Devices
, vol.29
, pp. 64-70
-
-
Kanda, Y.1
-
18
-
-
0026187499
-
Piezoresistance effect of silicon
-
Kanda Y 1991 Piezoresistance effect of silicon Sensors Actuators A 28 83-91.
-
(1991)
Sensors Actuators A
, vol.28
, pp. 83-91
-
-
Kanda, Y.1
-
19
-
-
3643050786
-
Piezoresistance of diffused layers in cubic semiconductors
-
Kerr D and Milnes A 1963 Piezoresistance of diffused layers in cubic semiconductors J. Appl. Phys. 34 727-31.
-
(1963)
J. Appl. Phys
, vol.34
, pp. 727-731
-
-
Kerr, D.1
Milnes, A.2
-
20
-
-
9944234936
-
First-order piezoresistance coefficients in silicon crystals
-
Kozlovskiy S and Boiko I 2006 First-order piezoresistance coefficients in silicon crystals Sensors Actuators A 118 33-43.
-
(2006)
Sensors Actuators A
, vol.118
, pp. 33-43
-
-
Kozlovskiy, S.1
Boiko, I.2
-
21
-
-
36149015753
-
Temperature dependence of the piezoresistance of high-purity silicon and germanium
-
Morin F J, Geballe T H and Herring C 1957 Temperature dependence of the piezoresistance of high-purity silicon and germanium Phys. Rev. 10 525-39.
-
(1957)
Phys. Rev
, vol.10
, pp. 525-539
-
-
Morin, F.J.1
Geballe, T.H.2
Herring, C.3
-
22
-
-
0011712475
-
Macroscopic symmetry and properties of crystals
-
Smith C S 1958 Macroscopic symmetry and properties of crystals Solid State Phys. 6 175-249.
-
(1958)
Solid State Phys
, vol.6
, pp. 175-249
-
-
Smith, C.S.1
-
23
-
-
0000023102
-
Piezoresistive properties of silicon diffused layers
-
Tufte O N and Stelzer E L 1963 Piezoresistive properties of silicon diffused layers J. Appl. Phys. 34 3322-7.
-
(1963)
J. Appl. Phys
, vol.34
, pp. 3322-3327
-
-
Tufte, O.N.1
Stelzer, E.L.2
-
24
-
-
34247602413
-
Transport and deformation potential theory for many valley semiconductors with anisotropic scattering
-
Herring C and Vogt E 1957 Transport and deformation potential theory for many valley semiconductors with anisotropic scattering Phys. Rev. 105 1933.
-
(1957)
Phys. Rev
, vol.105
, pp. 1933
-
-
Herring, C.1
Vogt, E.2
-
25
-
-
0021522633
-
Origin of the linear and nonlinear piezoresistance effects in p-type silicon Japan
-
Suzuki K, Hasegawa H and Kanda Y 1984 Origin of the linear and nonlinear piezoresistance effects in p-type silicon Japan. J. Appl. Phys. 23 L871-4.
-
(1984)
J. Appl. Phys
, vol.23
, pp. L871-L874
-
-
Suzuki, K.1
Hasegawa, H.2
Kanda, Y.3
-
26
-
-
34249846476
-
Semiconducting stress transducers utilizing the transverse and shear piezoresistance effects
-
Pfann W G and Thurston R N 1961 Semiconducting stress transducers utilizing the transverse and shear piezoresistance effects J. Appl. Phys. 32 2008-19.
-
(1961)
J. Appl. Phys
, vol.32
, pp. 2008-2019
-
-
Pfann, W.G.1
Thurston, R.N.2
-
28
-
-
43049090137
-
2008 High sensitivity MEMS strain sensor: Design and simulation
-
Mohammed A A S, Moussa W A and Lou E 2008 High sensitivity MEMS strain sensor: design and simulation Sensors 8 2642-61.
-
Sensors
, vol.8
, pp. 2642-2661
-
-
Mohammed, A.A.S.1
Moussa, W.A.2
Lou, E.3
-
29
-
-
0025698111
-
Noise in sensors
-
Bordoni F 1990 Noise in sensors Sensors Actuators A 21-23 17-24.
-
(1990)
Sensors Actuators A
, vol.21-23
, pp. 17-24
-
-
Bordoni, F.1
-
30
-
-
33646016277
-
Noise studies in implanted piezoresistors
-
Orlando, FL, USA, 2005
-
Davenport A A, Pruitt B and Lim P 2005 Noise studies in implanted piezoresistors 2005 ASME Int. Mechanical Engineering Congr. and Exposition, IMECE (Orlando, FL, USA, 2005).
-
(2005)
2005 ASME Int. Mechanical Engineering Congr. and Exposition, IMECE
-
-
Davenport, A.A.1
Pruitt, B.2
Lim, P.3
-
31
-
-
0032637197
-
Noise in piezoresistive atomic force microscopy
-
Hansen O and Boisen A 1999 Noise in piezoresistive atomic force microscopy Nanotechnology 10 51-60.
-
(1999)
Nanotechnology
, vol.10
, pp. 51-60
-
-
Hansen, O.1
Boisen, A.2
-
32
-
-
0033700892
-
1/f noise consideration for the design and process optimization of piezoresistive cantilevers
-
Harley J A and Kenny T W 2000 1/f noise consideration for the design and process optimization of piezoresistive cantilevers J. Microelectromech. Syst. 9 226-35.
-
(2000)
J. Microelectromech. Syst
, vol.9
, pp. 226-235
-
-
Harley, J.A.1
Kenny, T.W.2
-
34
-
-
0037113006
-
Optimization of sensitivity and noise in piezoresistive cantilevers
-
Yu X M, Thaysen J, Hansen O and Boisen A 2002 Optimization of sensitivity and noise in piezoresistive cantilevers J. Appl. Phys. 92 6296-301.
-
(2002)
J. Appl. Phys
, vol.92
, pp. 6296-6301
-
-
Yu, X.M.1
Thaysen, J.2
Hansen, O.3
Boisen, A.4
-
36
-
-
0038148955
-
Analysis, control and augmentation of microcantilever deflections in bio-sensing systems
-
Khaled A R A, Vafai K, Yang M, Zhang X and Ozkan C S 2003 Analysis, control and augmentation of microcantilever deflections in bio-sensing systems Sensors Actuators B 94 103-15.
-
(2003)
Sensors Actuators B
, vol.94
, pp. 103-115
-
-
Khaled, A.R.A.1
Vafai, K.2
Yang, M.3
Zhang, X.4
Ozkan, C.S.5
-
37
-
-
0242637014
-
High sensitivity piezoresistive cantilever design and optimization for analyte-receptor binding
-
Yang M, X Z, Vafai K and Ozkan C S 2003 High sensitivity piezoresistive cantilever design and optimization for analyte-receptor binding J. Micromech. Microeng. 13 842-72.
-
(2003)
J. Micromech. Microeng
, vol.13
, pp. 842-872
-
-
Yang, M.1
Vafai, K.2
Ozkan, C.S.3
-
38
-
-
33845659457
-
Design and analysis of piezoresistive microcantilever for surface stress measurement in biochemical sensor
-
Yang S M and Yin T I 2007 Design and analysis of piezoresistive microcantilever for surface stress measurement in biochemical sensor Sensors Actuators B 120 736-44.
-
(2007)
Sensors Actuators B
, vol.120
, pp. 736-744
-
-
Yang, S.M.1
Yin, T.I.2
-
39
-
-
33847292895
-
Cantilever sensor with stressconcentrating piezoresistor design
-
Naeli K and Brand O 2005 Cantilever sensor with stressconcentrating piezoresistor design Proc. IEEE pp 292-5.
-
(2005)
Proc. IEEE
, pp. 292-295
-
-
Naeli, K.1
Brand, O.2
-
40
-
-
0034511116
-
On the design of piezoresistive silicon cantilevers with stress concentration regions for scanning probe microscopy applications
-
Bashir R, Gupta A, Neudeck GW, McElfresh M and Gomez R 2000 On the design of piezoresistive silicon cantilevers with stress concentration regions for scanning probe microscopy applications J. Micromech. Microeng. 10 483-91.
-
(2000)
J. Micromech. Microeng
, vol.10
, pp. 483-491
-
-
Bashir, R.1
Gupta, A.2
Neudeck, G.W.3
McElfresh, M.4
Gomez, R.5
-
42
-
-
65949121149
-
Design and analysis of MEMS piezoresistive SiO2 cantilever-based sensor with stress concentration region for biosensing applications
-
Johor Bahru, Malaysia, 2008
-
Rahim R A, Bais B and Majlis B Y 2008 Design and analysis of MEMS piezoresistive SiO2 cantilever-based sensor with stress concentration region for biosensing applications ICSE 2008 Proc. (Johor Bahru, Malaysia, 2008).
-
(2008)
ICSE 2008 Proc
-
-
Rahim, R.A.1
Bais, B.2
Majlis, B.Y.3
-
43
-
-
0346280068
-
Computer simulation of the resonance characteristics and the sensitivity of cantilever-shaped Al/PZT/RuO2 biosensor
-
Ryu W H, Y C C, Choi D K, Yoon C S, Kim C K and Kim Y H 2004 Computer simulation of the resonance characteristics and the sensitivity of cantilever-shaped Al/PZT/RuO2 biosensor Sensor Actuators B 97 98-102.
-
(2004)
Sensor Actuators B
, vol.97
, pp. 98-102
-
-
Ryu, W.H.1
Choi, D.K.2
Yoon, C.S.3
Kim, C.K.4
Kim, Y.H.5
-
44
-
-
0003760432
-
-
London: Institution of Engineering and Technology
-
Hull R 1999 Properties of Crystalline Silicon (London: Institution of Engineering and Technology).
-
(1999)
Properties of Crystalline Silicon
-
-
Hull, R.1
-
47
-
-
8344259142
-
2004 Impact of self heating in a silicon MEMS piezoresistive pressure sensor
-
Pramanik C, Islam T and Saha H 2004 Impact of self heating in a silicon MEMS piezoresistive pressure sensor Sensor Lett. 2 131-7.
-
Sensor Lett
, vol.2
, pp. 131-137
-
-
Pramanik, C.1
Islam, T.2
Saha, H.3
|