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Volumn 228, Issue 3-4, 1996, Pages 363-368

Influence of built-in potential on the effective surface recombination velocity for a heavily doped high-low junction

Author keywords

Heavy doping; High low junction; Surface recombination velocity

Indexed keywords

NUMERICAL ANALYSIS; NUMERICAL METHODS; PERMITTIVITY; SEMICONDUCTOR DOPING; SEMICONDUCTOR JUNCTIONS;

EID: 0030286238     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(96)00474-7     Document Type: Article
Times cited : (6)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.