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Volumn 174, Issue 1, 1999, Pages 231-238
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Determination of the minority carrier lifetime in solar cells: A novel biased OCVD technique
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0009074333
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-396X(199907)174:1<231::AID-PSSA231>3.0.CO;2-8 Document Type: Article |
Times cited : (17)
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References (9)
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