Explanation of high solar cell diode factors by nonuniform contact resistance

Progress in Photovoltaics: Research and Applications

Volumn 13, Issue 1, 2005, Pages 3-16

  Van Der Heide, A S H ^a   Schonecker A ^a   Bultman, J H ^a   Sinke, W C ^a  

^a TNO   (Netherlands)

Author keywords

Contact resistance; Corescan; Diode factor; Fill factor; Series resistance; Solar cell

Indexed keywords

COMPUTER SIMULATION; CURRENT DENSITY; ELECTRIC CONTACTS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; PERFORMANCE; POLYSILICON; SOLAR CELLS;

CONTACT RESISTANCE; CORESCAN; DIODE FACTOR; FILL FACTOR; SERIES RESISTANCE; THERMAL VOLTAGE;

DIODES;

EID: 13244299144     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/pip.556     Document Type: Article

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