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Volumn 60, Issue 2, 2000, Pages 155-166
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Measurement and comparison of AC parameters of silicon (BSR and BSFR) and gallium arsenide (GaAs/Ge) solar cells used in space applications
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE MEASUREMENT;
DIFFUSION;
ELECTRIC RESISTANCE MEASUREMENT;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING GERMANIUM;
SEMICONDUCTOR DIODES;
SPACE APPLICATIONS;
SPECTROSCOPIC ANALYSIS;
DIFFUSION CAPACITANCE;
TRANSITION CAPACITANCE;
SILICON SOLAR CELLS;
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EID: 0013374871
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0248(99)00080-X Document Type: Article |
Times cited : (58)
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References (3)
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