Crystallization of ferroelectric lead zirconate titanate thin films by microwave annealing at low temperatures

Journal of the American Ceramic Society

Volumn 94, Issue 2, 2011, Pages 404-409

  Wang, Zhanjie ^a   Chen, Yanna ^a   Otsuka, Yuka ^b   Zhu, Mingwei ^a   Cao, Ziping ^b   Kokawa, Hiroyuki ^b  

^a INSTITUTE OF METAL RESEARCH   (China)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; CRYSTALLINE PHASIS; ELEVATED TEMPERATURE; FERROELECTRIC PROPERTY; LEAD ZIRCONATE TITANATE THIN FILMS; LOW TEMPERATURES; MICROSCOPIC STUDY; MICROWAVE ANNEALING; PEROVSKITE PHASE; PZT FILM; PZT THIN FILM; REMANENT POLARIZATION; SI SUBSTRATES; SINGLE MODE; SOL-GEL METHODS; THERMAL PROCESSING; TRANSMISSION ELECTRON;

ANNEALING; CRYSTALLIZATION; FERROELECTRICITY; IRRADIATION; MAGNETIC FIELDS; MICROWAVE HEATING; MICROWAVE IRRADIATION; PEROVSKITE; PHASE TRANSITIONS; SEMICONDUCTING LEAD COMPOUNDS; SOL-GEL PROCESS; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC FILMS;

EID: 79751514188     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2010.04094.x     Document Type: Article

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