Low-temperature growth of high-quality lead zirconate titanate thin films by 28 GHz microwave irradiation

Applied Physics Letters

Volumn 86, Issue 21, 2005, Pages 1-3

  Wang, Z J ^a   Kokawa, H ^a   Takizawa, H ^a   Ichiki, M ^b   Maeda, R ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; FILM GROWTH; LOW TEMPERATURE OPERATIONS; MICROWAVES; PERMITTIVITY; PEROVSKITE; REMANENCE; SOL-GELS; X RAY DIFFRACTION ANALYSIS;

LOW TEMPERATURE CRYSTALLIZATION; LOW TEMPERATURE GROWTH; REMANENT POLARIZATION; SPIN COATERS;

THIN FILMS;

EID: 20844448186     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1935748     Document Type: Article

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