Low-temperature crystallization of sol-gel-derived lead zirconate titanate thin films using 2.45 GHz microwaves

Thin Solid Films

Volumn 515, Issue 5, 2007, Pages 2891-2896

  Bhaskar, Ankam ^a   Chang, T H ^a   Chang, H Y ^b   Cheng, S Y ^c  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^c INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

Dielectric properties; Hysteresis loops; Lead zirconate titanate; Microwave annealing; Surface roughness

Indexed keywords

CRYSTALLIZATION; LEAD COMPOUNDS; LOW TEMPERATURE EFFECTS; MICROWAVES; PERMITTIVITY; SOL-GELS; SURFACE ROUGHNESS;

HYSTERESIS LOOPS; LEAD ZIRCONATE TITANATE; MICROWAVE ANNEALING; REMANENT POLARIZATION;

THIN FILMS;

EID: 33845947999     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.08.044     Document Type: Article

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