Microstructure and electrical properties of lead zirconate titanate thin films deposited by excimer laser ablation

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 9 B, 2001, Pages 5523-5527

  Wang, Zhan Jie ^a   Maeda, Ryutaro ^b   Ichiki, Masaaki ^b   Kokawa, Hiroyuki ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Ceramics; Dielectric properties; Ferroelectric properties; Laser ablation; Lead zirconate titanate (PZT); Microstructure

Indexed keywords

COERCIVE FORCE; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; ENERGY DISPERSIVE SPECTROSCOPY; EXCIMER LASERS; FILM PREPARATION; HYSTERESIS; PERMITTIVITY; PULSED LASER DEPOSITION; REMANENCE; SEMICONDUCTING LEAD COMPOUNDS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

LEAD ZIRCONATE TITANATE (PZT) FILMS;

THIN FILMS;

EID: 0035455043     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.5523     Document Type: Article

References (14)