Effect of microwave annealing temperatures on lead zirconate titanate thin films

Nanotechnology

Volumn 18, Issue 39, 2007, Pages

  Bhaskar, Ankam ^a,d   Chang, H Y ^b   Chang, T H ^a   Cheng, S Y ^c  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^c INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^d ENVIRONMENT CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

LEAD ZIRCONATE TITANATE; MICROWAVE ANNEALING; PEROVSKITE PHASES; SECONDARY PHASES;

ANNEALING; LEAD ALLOYS; MICROWAVES; PHASE TRANSITIONS; SURFACE STRUCTURE; X RAY DIFFRACTION;

THIN FILMS;

LEAD; LEAD TITANATE ZIRCONATE; PEROVSKITE; TITANIUM DERIVATIVE; UNCLASSIFIED DRUG; ZIRCONIUM DERIVATIVE;

ARTICLE; CRYSTAL STRUCTURE; CRYSTALLIZATION; DIELECTRIC CONSTANT; FILM; MICROWAVE RADIATION; MOLECULAR ELECTRONICS; PRIORITY JOURNAL; STRUCTURE ANALYSIS; TEMPERATURE; X RAY DIFFRACTION;

EID: 34548533617     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/39/395704     Document Type: Article

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