Nanoindentation and picoindentation measurements using a capacitive transducer system in atomic force microscopy

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 74, Issue 5, 1996, Pages 1117-1128

  Bhushan, Bharat ^a   Kulkarni, Ashok V ^a   Bonin, Waynbe ^b   Wyrobek, Jerzyt T ^b  

^a Ohio State University   (United States)

^b Bruker Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030293526     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619608239712     Document Type: Article

References (18)

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