Atom-Probe Tomographic Studies of Thin Films and Multilayers

MRS Bulletin

Volumn 34, Issue 10, 2009, Pages 732-737

  Larson, David J ^a   Cerezo, Alfred ^a   Juraszek, Jean ^a   Hono, Kazuhiro ^a   Schmitz, Guido ^a  

^a NONE

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EID: 84976876651     PISSN: 08837694     EISSN: 19381425     Source Type: Journal    
DOI: 10.1557/mrs2009.247     Document Type: Article

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